JPH0314409U - - Google Patents
Info
- Publication number
- JPH0314409U JPH0314409U JP7547489U JP7547489U JPH0314409U JP H0314409 U JPH0314409 U JP H0314409U JP 7547489 U JP7547489 U JP 7547489U JP 7547489 U JP7547489 U JP 7547489U JP H0314409 U JPH0314409 U JP H0314409U
- Authority
- JP
- Japan
- Prior art keywords
- smooth gloss
- gloss meter
- cylinder
- sensor body
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001179 sorption measurement Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Details Of Measuring And Other Instruments (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7547489U JPH0642169Y2 (ja) | 1989-06-27 | 1989-06-27 | 平滑光沢度計の位置固定機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7547489U JPH0642169Y2 (ja) | 1989-06-27 | 1989-06-27 | 平滑光沢度計の位置固定機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0314409U true JPH0314409U (en]) | 1991-02-14 |
JPH0642169Y2 JPH0642169Y2 (ja) | 1994-11-02 |
Family
ID=31616082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7547489U Expired - Fee Related JPH0642169Y2 (ja) | 1989-06-27 | 1989-06-27 | 平滑光沢度計の位置固定機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0642169Y2 (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009510419A (ja) * | 2005-09-27 | 2009-03-12 | シーメンス アクチエンゲゼルシヤフト | 基板の表面を検査するための測定装置および測定システム |
-
1989
- 1989-06-27 JP JP7547489U patent/JPH0642169Y2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009510419A (ja) * | 2005-09-27 | 2009-03-12 | シーメンス アクチエンゲゼルシヤフト | 基板の表面を検査するための測定装置および測定システム |
Also Published As
Publication number | Publication date |
---|---|
JPH0642169Y2 (ja) | 1994-11-02 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |